Electron Microscopy, Spectroscopy, Analytics

Dr. Tarek Lutz
Group Leader Interface and nanoanalytics

We investigate components, surfaces, interfaces and particles from cm to the atomic scale using accredited methods.

We offer a wide range of analytical systems for nanoanalytics, which cover sizes from cm to the atomic scale and achieve detection limits down to a few ppm. The Nanoanalytics Center is a focal point for companies with innovative, materials-related questions and product ideas.


Our services include:

  • Characterization of materials, coatings and layer systems
  • Characterization of extremely reactive components using inert and cryopreparation techniques
  • Investigation of internal interfaces, e.g. contact electrode with electrolyte in battery cells, membranes in fuel cells
  • Analysis of nanostructures, e.g. in solid-state electrolytes
  • Electron and ion microscopy with atomic resolution for chemical and physical characterization
Our equipment:
  • FIB/SEM Gerät Zeiss Auriga 40 mit EDX Und EBSD Detektor
  • FIB/SEM Gerät Zeiss Crossbeam 550 mit EDX Detector mit Quorum Aquilo cryo system
  • FIB/SEM Gerät Zeiss Crossbeam 350 mit SIMS-TOF und Femtosecondlaser und BSE Detektor
  • Jeol ARM 200F High Resolution Transmission Electron Microscope (TEM/STEM) mit CEOS Cs corrector Abbildung- und Sondenkorrektur