Electron Microscopy, Spectroscopy, Analytics

We investigate components, surfaces, interfaces and particles from cm to the atomic scale using accredited methods.

We offer a wide range of analytical systems for nanoanalytics, which cover sizes from cm to the atomic scale and achieve detection limits down to a few ppm. The Nanoanalytics Center is a focal point for companies with innovative, materials-related questions and product ideas.

Our services include:

• Characterization of materials, coatings and layer systems
• Characterization of extremely reactive components using inert and cryopreparation techniques
• Investigation of internal interfaces, e.g. contact electrode with electrolyte in battery cells, membranes in fuel cells
• Analysis of nanostructures, e.g. in solid-state electrolytes
• Electron and ion microscopy with atomic resolution for chemical and physical characterization

Our equipment:

• FIB/SEM Gerät Zeiss Auriga 40 mit EDX Und EBSD Detektor
• FIB/SEM Gerät Zeiss Crossbeam 550 mit EDX Detector mit Quorum Aquilo cryo system
• FIB/SEM Gerät Zeiss Crossbeam 350 mit SIMS-TOF und Femtosecondlaser und BSE Detektor
• Jeol ARM 200F High Resolution Transmission Electron Microscope (TEM/STEM) mit CEOS Cs corrector Abbildung- und Sondenkorrektur