Nanoanalytics on Materials

We test and analyze materials, coatings, nanoparticles and their surfaces for the industries of materials technology, mechanical engineering, electrical engineering, microsystems technology with a wide range of analytical methods.

In addition, we support you in the elucidation of phenomena at internal interfaces of workpieces. We systematically link all methods with each other (correlative nanoanalytics) in order to be able to provide an optimal answer to any question in the field of materials science.

Our equipment

• FIB/SEM instrument Zeiss Auriga 40 with EDX and EBSD detector
• FIB/SEM instrument Zeiss Crossbeam 550 with EDX Detector with Quorum Aquilo cryo system
• FIB/SEM instrument Zeiss Crossbeam 350 with SIMS-TOF and Femtosecondlaser and BSE Detector
• Jeol ARM 200F High Resolution Transmission Electron Microscope (TEM/STEM) with CEOS Cs corrector imaging and probe correction