Microscopy Conference 2019, Berlin

The NMI is strongly represented in Berlin.

This conference follows the tradition of the conference series of the German Society for Electron Microscopy (DGE) in aiming to attract students new in the field of electron microscopy, technicians looking for the latest equipment and scientific methods, and also experienced scientists and world-renowned experts exchanging ideas and establishing new collaborations.

Lecture from Antje Biesemeier Large volume FIB-SEM tomography of neovascular tissue in the rat eye ,
lecture from Christof Hofer, Revealing the 3D structure of graphene defects and electron-beam induced out-of-plane dynamics
and a poster from Maximilian Becker Microstructural modifications in Josephson junctions created by focused helium ion beam irradiation of Yba2Cu3O7


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