Maximilian Becker

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Maximilian Becker

Scientist Nanoanalytics
M.Sc. Physik
T +49 (0)7121 51530-908
F +49 (0)7121 51530-62

Publications

  • Rayleigh analysis and dielectric dispersion in polycrystalline 0.5(Ba0.7Ca0.3)TiO3– 0.5Ba(Zr0.2Ti0.8)O3 ferroelectric thin films by domain-wall pinning element modeling
    Becker M, Burkhardt C, Schröppel B, Kleiner R, Koelle D
    J. Appl. Phys. 128, 154103 (2020); https://doi.org/10.1063/5.0025109
  • Sputtered Iridium Oxide as Electrode Material for Subretinal Stimulation
    Haas J, Rudorf R, Becker M, Daschner R, Drzyzga A, Burkhardt C, Stett A
    Sensors and Materials, Vol. 32, No. 9 (2020) 2903–2918, https://doi.org/10.18494/SAM.2020.2903
  • Influence of Molybdenum Back Contact on the PID Effect for Cu(In,Ga)Se2 Solar Cells
    Salomon O, Hempel W, Kiowski O, Lotter E, Witte W, Ferati A, Schneikart A, Kaune G, Schäffler R, Becker M, Schröppel B, Vidal Lorbada R, Mücke D and Walter T
    Coatings 2019, 9(12), 794; https://doi.org/10.3390/coatings9120794
  • Josephson junctions and SQUIDs created by focused helium-ion-beam irradiation of YBa2Cu3O7
    Müller B, Karrer M, Limberger F, Becker M, Schröppel B, Burkhardt CJ, Kleiner R, Goldobin E, Koelle D
    Phys. Rev. Applied 11, 044082 – Published 25 April 2019