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Maximilian Becker
Scientist Nanoanalytics
M.Sc. Physik
T +49 (0)7121 51530-908
F +49 (0)7121 51530-62
Publications
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Rayleigh analysis and dielectric dispersion in polycrystalline 0.5(Ba0.7Ca0.3)TiO3– 0.5Ba(Zr0.2Ti0.8)O3 ferroelectric thin films by domain-wall pinning element modelingBecker M, Burkhardt C, Schröppel B, Kleiner R, Koelle DJ. Appl. Phys. 128, 154103 (2020); https://doi.org/10.1063/5.0025109
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Sputtered Iridium Oxide as Electrode Material for Subretinal StimulationHaas J, Rudorf R, Becker M, Daschner R, Drzyzga A, Burkhardt C, Stett ASensors and Materials, Vol. 32, No. 9 (2020) 2903–2918, https://doi.org/10.18494/SAM.2020.2903
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Influence of Molybdenum Back Contact on the PID Effect for Cu(In,Ga)Se2 Solar CellsSalomon O, Hempel W, Kiowski O, Lotter E, Witte W, Ferati A, Schneikart A, Kaune G, Schäffler R, Becker M, Schröppel B, Vidal Lorbada R, Mücke D and Walter TCoatings 2019, 9(12), 794; https://doi.org/10.3390/coatings9120794
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Josephson junctions and SQUIDs created by focused helium-ion-beam irradiation of YBa2Cu3O7Müller B, Karrer M, Limberger F, Becker M, Schröppel B, Burkhardt CJ, Kleiner R, Goldobin E, Koelle DPhys. Rev. Applied 11, 044082 – Published 25 April 2019