Imaging of Cell-to-Material Interfaces by SEM after in situ Focused Ion Beam Milling on Flat Surfaces and Complex 3D-Fibrous Structures

Imaging of Cell-to-Material Interfaces by SEM after in situ Focused Ion Beam Milling on Flat Surfaces and Complex 3D-Fibrous Structures
Bittermann AG, Burkhardt C, Hall H
Advanced Engineering Materials. 2009 Nov; 11(11): B182-B188. DOI 10.1002/adem.200900080

Detailed analysis of the cell‐to‐implant interface needs to be performed prior to medical application. As these interfaces are often not accessible for direct visualization SEM after in situ focused ion beam milling was explored that allows selecting the regions of interest and serial sectioning for analysis of large scale implant architecture/topology down to detailed sub‐cellular structures in one sample that might be very useful for (bio)material characterization.