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July 28-29, 2015 - Workshop Correlative AFM & Raman Imaging for advanced characterisation of polymer, carbon and graphene nano-materials

This two day workshop will give an overview to state of the art AFM, Raman and TERS imaging systems and applications. Examples for advanced material characterisation beyond morphology (nano-chemical, nano-electrical and nano-mechanical properties) will be presented and demonstrated.

Programme download.

Three AFM and Raman Systems from Bruker and Renishaw are available for live demonstration of selected user samples.

Online registration (credit card required):

Registration fee:
Industry    140 Euro
Academics     110 Euro
Students    50 Euro

(Fees include lunches and coffee/tea/refreshments. Social event are included, please register online for this meeting highlight.)

 

If you prefer to pay by bank transfer, please sent us an email (workshop(at)nmi.de ) with your

 

Title, First Name, Last Name
Affiliation    
Address, City, Postcode, Country    
Phone

 

We will send you an invoice in due course.

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